Advancing Automotive Semiconductor Verification Through Simulation-Based Methodologies
DOI:
https://doi.org/10.32996/jcsts.2025.7.4.23Keywords:
Automotive Semiconductor Verification, Simulation-Centric Testing, Mixed-Signal Verification, Fault Injection Testing, Advanced Driver-Assistance SystemsAbstract
The rise of advanced driver-assistance systems (ADAS) and electric vehicles has placed unprecedented demands on automotive semiconductor designs. This article explores simulation-centric methodologies tailored to meet the stringent safety and reliability requirements of the automotive industry. The article focuses on compliance with standards like ISO 26262 and emphasizes fault injection testing as a core component of the verification process. Mixed-signal simulations play a crucial role in validating interactions between analog and digital components, ensuring seamless integration in automotive ICs. By incorporating advanced reliability metrics and failure mode analysis, the framework addresses potential vulnerabilities early in the design phase. Case studies from powertrain and ADAS IC projects demonstrate how simulation-based verification tools have significantly reduced defect rates while accelerating time-to-market and ensuring compliance with industry standards.